We supply custom-built interferometers, based on Fizeau design and intended for contactless measurement of optical surface geometry. Fizeau interferometers are used both for monitoring of planeness errors on objects of up to 300 m in diameter and of sphericity errors on spherical surfaces, and for other wavefront deformation measurements.
Item diameter: 10-100 mm (up to 300 mm, if requested)
Precision: λ/20 (P-V)(for visualization)
Amplitude of measured aberrations (P-V): up to 10λ
Radiation source: HeNe laser
Radiation source wavelength: 0.632 mcm
Visualization of interference pattern: CCD camera + display or PC
PC software may be used for measuring interferences. Software enables processing of interference patterns both in real-time and saved as BMP files. Precision of the processing is λ/400. The processing results are provided as Zernike polynomial coefficients and as P-V and RMS, 2D and 3D phase distribution.
Registration of the interference pattern (or download as BMP file)
Determination of measurement area
Filtration to eliminate false extremums and noise
Identification of extremums
Phase recovery based on position references of extremums, Zernike polynomial expansion, computation of P-V, RMS
User-friendly presentation of measurement results based on data obtained, including for compilation of a measurement protocol based
If requested by customer special-purpose hardware-software complexes provided for high-precision control of optical devices in deep ultraviolet (248nm) and mid infrared (8-14 mcm) renge based on reference model
Various optional interferometer heads and accessories are available for supply.